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Mad City Labs announces the release of MCL-NSOM, a versatile near field scanning optical microscope (NSOM). The MCL-NSOM leverages our expertise with high-resolution SPM instrumentation and our core ...
From the inception of the groundbreaking nGauge AFM to the launch of the innovative Redux AFM, David Morris, Director of Operations, shares insights on ICSPI's mission to enhance accessibility and ...
Failure analysis typically begins with identifying a region of interest (ROI) on a sample for detailed examination using tools such as a Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), or ...
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