For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...

When a global provider of air traffic, navigation, and landing system solutions began implementing its next-generation system, limitations of an existing test and debug methodology directly impacted ...