Abstract: Chip test escapes can pass the complete test procedure but fail prematurely in system applications. Statistical testing methods can screen chip test escapes by analyzing test data without ...
You don’t see them much anymore, but there was a time when any hobbyist who dealt with RF probably had a grid dip meter. The ...
Abstract: Aiming at the problem of low energy conversion efficiency of triboelectric nanogenerator(TENG), a contact-separated TENG is used as the research object, and ...
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