AZoM on MSN

Improving EBSD of Nickel Alloys with Schottky FE-SEM

Learn how cutting-edge BIB milling techniques refine EBSD analysis, delivering high-resolution results for nickel alloys and ...
AZoM on MSN

Powerful SEM Technology for the Tabletop

Experience powerful tabletop SEM technology with advanced imaging performance for research, industry, and educational applications.
AZoM

A New Approach to High Quality SEM Sample Preparation

Optimize SEM analysis with Broad Ion Beam Milling, a cutting-edge technique for preparing intricate specimens, ensuring ...
Silicon Semiconductor

3D-Micromac introduces next-generation Laser Sample Preparation Platform

The new microPREP L system will be featured at the upcoming International Symposium for Testing and Failure Analysis (ISTFA), taking place Nov. 16-20 in Pasadena, Calif. Attendees are invited to visit ...
C&EN

Nitrosamine Control: From Risk Assessment to Analytical Testing with Emphasis on Sample Preparation and Phase-Appropriate Method Validation

Creative Commons (CC): This is a Creative Commons license. Attribution (BY): Credit must be given to the creator. In recent years, the detection of nitrosamine impurities in pharmaceuticals has ...
IEEE

A Fast Failure Diagnosis Method of Planar Arrays From Far-Field Samples

Abstract: In this letter, a general coarse-to-fine failure diagnosis method is proposed to accelerate the planar array diagnosis using far-field samples. First, a specific azimuth angle is selected to ...